[1]
Z. Wang, B. Zhong, D. Han, and K.-K. Ma, “Contrast-Guided Line Segment Detection,”
IEEE Signal Processing Letters, vol. 31, pp. 281–285, 2024, doi:
10.1109/LSP.2023.3346281.
[2]
Z. Wang, B. Zhong, X. Chen, and H. Zheng, “MPG-LSD: A high-quality line segment detector based on multi-scale perceptual grouping,”
Pattern Recognition, vol. 149, p. 110286, 2024, doi:
https://doi.org/10.1016/j.patcog.2024.110286.
[3]
X. Zhang, C. Hu, H. Liu, R. Du, X. Zhou, and L. Wang, “A Line Segment Detector for Space Target Images Robust to Complex Illumination,”
Aerospace, vol. 10, no. 2, 2023, doi:
10.3390/aerospace10020195.
[4]
B. Cyrille and L. Simon, “DSeg: Direct Line Segments Detection.” 2023.
[5]
D. Wang, Q. Liu, Q. Yin, and F. Ma, “Fast Line Segment Detection and Large Scene Airport Detection for PolSAR,”
Remote Sensing, vol. 14, no. 22, 2022, doi:
10.3390/rs14225842.
[6]
Y. Zhang, D. Wei, and Y. Li, “AG3line: Active grouping and geometry-gradient combined validation for fast line segment extraction,”
Pattern Recognition, vol. 113, p. 107834, 2021, doi:
https://doi.org/10.1016/j.patcog.2021.107834.
[7]
Q. Yu, G. Xu, Y. Cheng, and Z. H. Zhu, “PLSD: A Perceptually Accurate Line Segment Detection Approach,”
IEEE Access, vol. 8, pp. 42595–42607, 2020, doi:
10.1109/ACCESS.2020.2977119.
[8]
I. Suárez, E. Muñoz, J. M. Buenaposada, and L. Baumela, “FSG: A statistical approach to line detection via fast segments grouping,” in
2018 IEEE/RSJ International Conference on Intelligent Robots and Systems (IROS), 2018, pp. 97–102. doi:
10.1109/IROS.2018.8594434.
[9]
N.-G. Cho, A. Yuille, and S.-W. Lee, “A Novel Linelet-Based Representation for Line Segment Detection,”
IEEE Transactions on Pattern Analysis and Machine Intelligence, vol. 40, no. 5, pp. 1195–1208, 2018, doi:
10.1109/TPAMI.2017.2703841.
[10]
V. Pătrăucean, P. Gurdjos, and R. Grompone von Gioi, “Joint <italic>A Contrario</italic> Ellipse and Line Detection,”
IEEE Transactions on Pattern Analysis and Machine Intelligence, vol. 39, no. 4, pp. 788–802, 2017, doi:
10.1109/TPAMI.2016.2558150.
[11]
C. Zhao, H. Zhao, J. Lv, S. Sun, and B. Li, “Multimodal image matching based on Multimodality Robust Line Segment Descriptor,”
Neurocomputing, vol. 177, pp. 290–303, 2016, doi:
https://doi.org/10.1016/j.neucom.2015.11.025.
[12]
Y. Salaün, R. Marlet, and P. Monasse, “Multiscale line segment detector for robust and accurate SfM,” in
2016 23rd International Conference on Pattern Recognition (ICPR), 2016, pp. 2000–2005. doi:
10.1109/ICPR.2016.7899930.
[13]
N. Hamid and N. Khan, “LSM: perceptually accurate line segment merging,”
Journal of Electronic Imaging, vol. 25, no. 6, p. 061620, 2016, doi:
10.1117/1.JEI.25.6.061620.
[14]
C. Brändli, J. Strubel, S. Keller, D. Scaramuzza, and T. Delbruck, “ELiSeD — An event-based line segment detector,” in
2016 Second International Conference on Event-based Control, Communication, and Signal Processing (EBCCSP), 2016, pp. 1–7. doi:
10.1109/EBCCSP.2016.7605244.
[15]
V. Pătrăucean, P. Gurdjos, and R. G. von Gioi, “A Parameterless Line Segment and Elliptical Arc Detector with Enhanced Ellipse Fitting,” in Computer Vision – ECCV 2012, A. Fitzgibbon, S. Lazebnik, P. Perona, Y. Sato, and C. Schmid, Eds., Berlin, Heidelberg: Springer Berlin Heidelberg, 2012, pp. 572–585.
[16]
R. Grompone von Gioi, J. Jakubowicz, J.-M. Morel, and G. Randall, “LSD: a Line Segment Detector,” Image Processing On Line, vol. 2, pp. 35–55, 2012.
[17]
R. Grompone von Gioi, J. Jakubowicz, J.-M. Morel, and G. Randall, “LSD: A Fast Line Segment Detector with a False Detection Control,”
IEEE Transactions on Pattern Analysis and Machine Intelligence, vol. 32, no. 4, pp. 722–732, 2010, doi:
10.1109/TPAMI.2008.300.
[18]
R. G. von Gioi, J. Jakubowicz, J.-M. Morel, and G. Randall, “On Straight Line Segment Detection,” Journal of Mathematical Imaging and Vision, vol. 32, pp. 313–347, 2008.
[19]
J. B. Burns, A. R. Hanson, and E. M. Riseman, “Extracting Straight Lines,”
IEEE Transactions on Pattern Analysis and Machine Intelligence, vol. PAMI-8, no. 4, pp. 425–455, 1986, doi:
10.1109/TPAMI.1986.4767808.